Exam Details
Subject | characterization of materials | |
Paper | ||
Exam / Course | mba | |
Department | ||
Organization | VELALAR COLLEGE OF ENGINEERING AND TECHNOLOGY | |
Position | ||
Exam Date | May, 2017 | |
City, State | tamil nadu, thindal |
Question Paper
QP Code
1
6
0
1
0
3
Register Number
VELALAR COLLEGE OF ENGINEERING AND TECHNOLOGY
(An Autonomous Institution, Affiliated to Anna University, Chennai)
Semester Examinations Apr May 2017
Regulations-2016
Programme:
Ph.D
Semester:
2
Max. Marks:
100
Duration
3 Hrs
Course Code Title:
16PCC02
CHARACTERIZATION OF MATERIALS
Knowledge Levels
K1 Remembering
K3 Applying
K5 Evaluating
K2 Understanding
K4 Analyzing
K6 Creating
Part A Answer ALL Questions. 10 x 2 20 Marks
No.
Question
KL
1.
Write the role of cooling curve in differential thermal analysis.
K6
2.
Define Specific heat capacity.
K1
3.
Distinguish between bright field and dark field optical microscopy.
K5
4.
Define Holographic microscopy.
K1
5.
Define Photoluminescence.
K1
6.
Justify the role of EDAX in electron microscopy.
K5
7.
Write down the properties can be calculated using Van der Pauw method.
K3
8.
Classify the super capacitance.
K2
9.
State the principle of FT-IR spectroscopy.
K1
10.
Point out any two applications of Rutherford back scattering analysis.
K4
Part B Answer ALL Questions. 5 x 16 80 Marks
No
Question
Marks
KL
11.
a
i.
Determine the procedure to indentify the weight loss and decomposition of products.
10
K3
ii.
Explain the working of thermogravimetric analysis.
6
K4
OR
b
i.
Explain the working principle of differential scanning calorimetry.
8
K4
ii.
Determine the different parameters of thermomechanical analysis.
8
K3
12.
a
i.
Explain dark field optical microscopic technique for the sample analysis.
10
K3
ii.
Distinguish between dispersion staining and phase contrast microscopy.
6
K4
OR
b
Summarize the working of Atomic Force Microscope(AFM) and write down the method of analyze the given sample
16
K5
13.
a
Explain the working principle of Transmission Electron Microscopy and write down the limitations of TEM
16
K4
OR
b
i.
Draw the neat diagram and explain the working of SEM
10
K3
ii.
Distinguish between photoluminescence and Electroluminescence.
6
K4
14.
a
What is Hall effect? Determine the Hall Coefficient of the given sample and measure the hall voltage using the experimental setup of Hall probe method
16
K5
OR
b
i.
Explain Schottky barrier capacitance and give its importance.
12
K2
ii.
Summarize the role of impurity concentration for the sample analysis
4
K5
15.
a
Explain the principle and working of Raman Spectroscopy and write down the advantages and disadvantages of Raman spectroscopy
16
K2
OR
b
i.
Explain how the important parameters of the sample can be identified using SIMS photon induced X-ray emission spectrum.
10
K2
ii.
List the applications of Mossbauer spectroscopy.
6
K1
1
6
0
1
0
3
Register Number
VELALAR COLLEGE OF ENGINEERING AND TECHNOLOGY
(An Autonomous Institution, Affiliated to Anna University, Chennai)
Semester Examinations Apr May 2017
Regulations-2016
Programme:
Ph.D
Semester:
2
Max. Marks:
100
Duration
3 Hrs
Course Code Title:
16PCC02
CHARACTERIZATION OF MATERIALS
Knowledge Levels
K1 Remembering
K3 Applying
K5 Evaluating
K2 Understanding
K4 Analyzing
K6 Creating
Part A Answer ALL Questions. 10 x 2 20 Marks
No.
Question
KL
1.
Write the role of cooling curve in differential thermal analysis.
K6
2.
Define Specific heat capacity.
K1
3.
Distinguish between bright field and dark field optical microscopy.
K5
4.
Define Holographic microscopy.
K1
5.
Define Photoluminescence.
K1
6.
Justify the role of EDAX in electron microscopy.
K5
7.
Write down the properties can be calculated using Van der Pauw method.
K3
8.
Classify the super capacitance.
K2
9.
State the principle of FT-IR spectroscopy.
K1
10.
Point out any two applications of Rutherford back scattering analysis.
K4
Part B Answer ALL Questions. 5 x 16 80 Marks
No
Question
Marks
KL
11.
a
i.
Determine the procedure to indentify the weight loss and decomposition of products.
10
K3
ii.
Explain the working of thermogravimetric analysis.
6
K4
OR
b
i.
Explain the working principle of differential scanning calorimetry.
8
K4
ii.
Determine the different parameters of thermomechanical analysis.
8
K3
12.
a
i.
Explain dark field optical microscopic technique for the sample analysis.
10
K3
ii.
Distinguish between dispersion staining and phase contrast microscopy.
6
K4
OR
b
Summarize the working of Atomic Force Microscope(AFM) and write down the method of analyze the given sample
16
K5
13.
a
Explain the working principle of Transmission Electron Microscopy and write down the limitations of TEM
16
K4
OR
b
i.
Draw the neat diagram and explain the working of SEM
10
K3
ii.
Distinguish between photoluminescence and Electroluminescence.
6
K4
14.
a
What is Hall effect? Determine the Hall Coefficient of the given sample and measure the hall voltage using the experimental setup of Hall probe method
16
K5
OR
b
i.
Explain Schottky barrier capacitance and give its importance.
12
K2
ii.
Summarize the role of impurity concentration for the sample analysis
4
K5
15.
a
Explain the principle and working of Raman Spectroscopy and write down the advantages and disadvantages of Raman spectroscopy
16
K2
OR
b
i.
Explain how the important parameters of the sample can be identified using SIMS photon induced X-ray emission spectrum.
10
K2
ii.
List the applications of Mossbauer spectroscopy.
6
K1
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